Semiconductor devices having staggered air gaps

ABSTRACT

A semiconductor device includes a substrate, a plurality of first conductive patterns disposed on the substrate and a plurality of second conductive patterns disposed on the first conductive patterns. Respective air gaps are disposed between adjacent ones of the first conductive patterns overlying a first region of the substrate, while adjacent ones of the first conductive patterns overlying a second region of the substrate do not have air gaps disposed therebetween. The air gaps may include first air gaps, and the device may further include second air gaps disposed between adjacent ones of the second conductive patterns in the second region. Adjacent ones of the second conductive patterns overlying a second region of the substrate may not have air gaps disposed therebetween.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application is a continuation of U.S. patent application Ser. No. 14/679,786, filed Apr. 6, 2015 in the United States Patent and Trademark Office and claims priority to Korean Patent Application No. 10-2014-0041160 filed on Apr. 7, 2014 in the Korean Intellectual Property Office (KIPO), the contents of each are herein incorporated by reference in their entireties.

TECHNICAL FIELD

The present inventive concepts relate to semiconductor devices and, more particular, semiconductor devices including air gaps.

DESCRIPTION OF RELATED ART

It is desirable for semiconductor devices to be highly integrated, dense, with low power consumption, high speed, and other performance characteristics. Some highly integrated semiconductor devices include multiple interconnection layers, each including a plurality of conductive patterns. As feature sizes of semiconductor devices have decreased, distances between adjacent conductive patterns have been narrowed. Because of the reduced separation, interference between the adjacent conductive patterns may be generated by parasitic capacitance, which may negatively impact data transfer. Therefore, various techniques have been proposed to reduce parasitic capacitance between adjacent conductive patterns.

Some of these techniques involve the use of air gaps to reduce capacitive coupling between conductors. Such techniques are described, for example, in U.S. Pat. No. 7,253,095 to Lur et al., U.S. Pat. No. 8,034,693 to Shibata et al, and U.S. Pat. No. 8,642,252 to Clevenger et al.

SUMMARY

According to some embodiments, a semiconductor device includes a substrate, a plurality of first conductive patterns disposed on the substrate, and a plurality of second conductive patterns disposed on the first conductive patterns. Respective air gaps are disposed between adjacent ones of the first conductive patterns overlying a first region of the substrate, while adjacent ones of the first conductive patterns overlying a second region of the substrate do not have air gaps disposed therebetween. The air gaps may include first air gaps, and the device may further include second air gaps disposed between adjacent ones of the second conductive patterns overlying the second region of the substrate. Adjacent ones of the second conductive patterns overlying the first region of the substrate may not have air gaps disposed therebetween.

The first and second conductive patterns may be conductive lines extending along the same direction. The first and second conductive patterns may include conductive lines extending along a first direction and the first region of the substrate may be adjacent the second region along a second direction transverse to the first direction.

In some embodiments, the second air gaps do not overlie the first air gaps.

In further embodiments, the semiconductor device may further include an interlayer dielectric layer between the first conductive patterns in the second region and a mask pattern on the interlayer dielectric layer.

In some embodiments, the first conductive patterns may include a plurality of conductive plugs vertically overlapped by the mask pattern. Sidewalls of the conductive plugs may contact the interlayer dielectric layer.

In some embodiments, the mask pattern overlies the second region of the substrate but does not overlie the first region of the substrate. The mask pattern may have a mechanical strength greater than that of the interlayer dielectric layer.

According to further embodiments, the semiconductor device further includes third conductive patterns on the second conductive patterns. Respective third air gaps are disposed between adjacent ones of the third conductive patterns and overlying the first region of the substrate, wherein adjacent ones of the third conductive patterns overlying the second region of the substrate do not have air gaps disposed therebetween.

According to further embodiments, the device may further include a second interlayer dielectric layer between the second conductive patterns in the first region and a second mask pattern on the second interlayer dielectric layer. The second mask pattern may overlie the first region of the substrate but not overlie the second region of the substrate. The second mask pattern may overlap the first mask pattern.

The semiconductor device may further include a first metal oxynitride layer disposed between the first mask pattern and the first interlayer dielectric layer and a second metal oxynitride layer disposed between the second mask pattern and the second interlayer dielectric layer.

Further embodiments provide a semiconductor device including a substrate and a plurality of first conductive patterns disposed on the substrate. Respective first air gaps are disposed between adjacent ones of the first conductive patterns overlying a first region of the substrate. The device further includes a plurality of second conductive patterns disposed on the first conductive patterns. Respective second air gaps are disposed between adjacent ones of the second conductive patterns overlying a second region of the substrate. Adjacent ones of the first conductive patterns overlying the second region of the substrate do not have air gaps disposed therebetween and adjacent ones of the second conductive patterns overlying the first region of the substrate do not have air gaps disposed therebetween.

The device may further include a first interlayer dielectric layer disposed between the first conductive patterns overlying the second region of the substrate and a second interlayer dielectric layer disposed between the second conductive patterns overlying the first region of the substrate. The device may also include a first mask pattern disposed on the first interlayer dielectric layer overlying the second region of the substrate. The device may further include a second mask pattern disposed on the second interlayer dielectric layer overlying the first region of the substrate and a plurality of third conductive patterns disposed on the second mask pattern.

Further embodiments provide a semiconductor device including a substrate and a plurality of first conductive patterns disposed on the substrate. Respective first air gaps are disposed between adjacent ones of the plurality of first conductive patterns overlying a first region of the substrate. The device further includes a plurality of second conductive patterns disposed on the first conductive patterns. Respective second air gaps are disposed between adjacent ones of the plurality of second conductive patterns overlying a second region of the substrate. A mask pattern is disposed between the first conductive patterns and the second conductive patterns and not overlapping the first air gaps.

Still further embodiments provide a semiconductor device including a substrate, an interlayer dielectric layer disposed on the substrate, first conductive lines disposed in the interlayer dielectric layer and second conductive lines disposed in a recess in the interlayer dielectric layer. The device further includes a diffusion barrier layer disposed on and between adjacent ones of the second conductive lines in the recess in the interlayer dielectric layer. The diffusion barrier layer defines respective air gaps between sidewalls of adjacent ones of the second conductive lines. The diffusion barrier layer may also overlie the first conductive lines and the device may further include a strengthening layer interposed between the interlayer dielectric layer and the diffusion barrier layer and overlying the first conductive lines. The strengthening layer may not overlie the second conductive lines.

According to further embodiments, the interlayer dielectric layer comprises a first interlayer dielectric layer, the diffusion barrier layer comprises a first diffusion barrier layer, the air gaps comprise first air gaps, and the device further includes a second interlayer dielectric layer on the first barrier diffusion layer, third conductive lines disposed in the interlayer dielectric layer overlying the second conductive lines, fourth conductive lines disposed in a recess in the second interlayer dielectric layer overlying the first conductive lines and a second diffusion barrier layer disposed on and between adjacent ones of the fourth conductive lines in the recess in the second interlayer dielectric layer. The second diffusion barrier layer defines respective second air gaps between sidewalls of adjacent ones of the fourth conductive lines. The first diffusion barrier layer may also overlie the first conductive lines and the device may further include a first strengthening layer interposed between the first interlayer dielectric layer and the first diffusion barrier layer and overlying the first conductive lines. The second diffusion barrier may also overlie the third conductive lines and the device may further include a second strengthening layer interposed between the second interlayer dielectric layer and the second diffusion barrier layer and overlying the third conductive lines.

BRIEF DESCRIPTION OF THE DRAWINGS

These and other features of the inventive concept will become more apparent by describing in detail exemplary embodiments thereof with reference to the accompanying drawings of which:

FIG. 1 is a plan view illustrating semiconductor devices according to some embodiments of the inventive concepts.

FIG. 2A is a cross-sectional view corresponding to line I-I′ of FIG. 1.

FIG. 2B is a cross-sectional view corresponding to line II-II′ of FIG. 1.

FIG. 2C is a cross-sectional view corresponding to line III-III′ of FIG. 1.

FIGS. 3 through 11 are cross-sectional views illustrating operations for fabricating semiconductor devices according to some embodiments of the inventive concepts.

FIG. 12 is a plan view illustrating semiconductor devices according to further embodiments of the inventive concepts.

FIG. 13 is a cross-sectional view corresponding to line I-I′ of FIG. 12.

FIG. 14 is a plan view illustrating semiconductor devices according to still further embodiments of the inventive concepts.

FIG. 15a is a cross-sectional view corresponding to line I-I′ of FIG. 14.

FIG. 15b is a cross-sectional view corresponding to line II-II′ of FIG. 14.

FIG. 15c is a cross-sectional view corresponding to line III-III′ of FIG. 14.

FIG. 15d is a cross-sectional view corresponding to line IV-IV′ of FIG. 14.

FIG. 16 is a cross-sectional view, corresponding to line I-I′ of FIG. 1, illustrating semiconductor devices according to some embodiments of the inventive concepts.

FIG. 17 is a cross-sectional view illustrating semiconductor devices according to some embodiments of the inventive concepts.

FIG. 18 is a plan view illustrating semiconductor devices according to still further embodiments of the inventive concepts.

FIG. 19 is a cross-sectional view corresponding to line I-I′ of FIG. 18.

FIG. 20 is a plan view illustrating semiconductor devices according to additional embodiments of the inventive concepts.

FIG. 21 is a cross-sectional view corresponding to line I-I′ of FIG. 20.

FIG. 22 is a block diagram of electronic systems including semiconductor devices according to some embodiments of the inventive concepts.

DETAILED DESCRIPTION

Exemplary embodiments of the inventive concepts will now be described more fully hereinafter with reference to the accompanying drawings; however, they may be embodied in different forms and should not be construed as limited to the exemplary embodiments set forth herein.

It will be understood that when an element is referred to as being “on,” “connected” or “coupled” to another element, it can be directly on, connected or coupled to the other element or intervening elements may be present. In contrast, when an element is referred to as “contacting,” or being “directly on,” “directly connected” or “directly coupled” to another element, there are no intervening elements present. Other words used to describe the , relationship between elements or layers should be interpreted in a like fashion (e.g., “between” versus “directly between,” “adjacent” versus “directly adjacent,” “under” versus “directly under”).

It will be understood that, although the terms “first”, “second”, etc., may be used herein to describe various elements, components, regions, layers and/or sections, these elements, components, regions, layers and/or sections should not be limited by these terms. Unless the context indicates otherwise, these terms are only used to distinguish one element, component, region, layer or section from another element, component, region, layer or section. Thus, a first element, component, region, layer or section discussed below could be termed a second element, component, region, layer or section without departing from the teachings of example embodiments.

In the figures, the dimensions of layers and regions may be exaggerated for clarity of illustration.

Spatially relative terms, e.g., “beneath,” “below,” “lower,” “above,” “upper” and the like, may be used herein for ease of description to describe the relationship of one element or feature to another element(s) or feature(s), as illustrated in the figures. It will be understood that the spatially relative terms are intended to encompass different orientations of the device in use or operation in addition to the orientation depicted in the figures. For example, if the device in the figures is turned over, elements described as “below” or “beneath” other elements or features would then be oriented “above” the other elements or features. Thus, the exemplary term “below” can encompass both an orientation of above and below. The device may be otherwise oriented (rotated 90 degrees or at other orientations) and the spatially relative descriptors used herein interpreted accordingly.

As used herein, the term “and/or” includes any and all combinations of one or more of the associated listed items. The use of the terms “a” and “an” and “the” and similar referents in the context of describing embodiments (especially in the context of the following claims) are to be construed to cover both the singular and the plural, unless otherwise indicated herein or clearly contradicted by context. The terms “comprising,” “having,” “including,” and “containing” are to be construed as open-ended terms (i.e., meaning “including, but not limited to”) unless otherwise noted.

Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art. It is noted that the use of any and all examples, or exemplary terms provided herein is intended merely to better illuminate the example embodiments and is not a limitation on the scope of the inventive concepts unless otherwise specified.

Example embodiments will be described with reference to perspective views, cross-sectional views, and/or plan views. The profile of an example view may be modified according to, e.g., manufacturing techniques and/or allowances. Accordingly, the example embodiments are not intended to limit the scope, but cover all changes and modifications that can be caused due to, e.g., a change in manufacturing process. Thus, regions shown in the drawings are illustrated in schematic form and the shapes of the region are presented simply by way of illustration and not as a limitation.

Unless the context indicates otherwise, terms such as “same,” “equal,” “planar,” or “coplanar,” as used herein when referring to orientation, layout, location, shapes, sizes, amounts, or other measures do not necessarily mean an exactly identical orientation, layout, location, shape, size, amount, or other measure, but are intended to encompass nearly identical orientation, layout, location, shapes, sizes, amounts, or other measures within acceptable variations that may occur, for example, due to manufacturing processes. The term “substantially” may be used herein to reflect this meaning.

Although corresponding plan views and/or perspective views of some cross-sectional view(s) may not be shown, the cross-sectional view(s) of device structures illustrated herein provide support for a plurality of device structures that extend along two different directions as would be illustrated in a plan view, and/or in three different directions as would be illustrated in a perspective view. The two different directions may or may not be orthogonal to each other. The three different directions may include a third direction that may be orthogonal to the two different directions. The plurality of device structures may be integrated in a same electronic device. For example, when a device structure (e.g., a memory cell structure or a transistor structure) is illustrated in a cross-sectional view, an electronic device may include a plurality of the device structures (e.g., memory cell structures or transistor structures), as would be illustrated by a plan view of the electronic device. The plurality of device structures may be arranged in an array and/or in a two-dimensional pattern.

Hereinafter, exemplary embodiments of the inventive concepts will be described in detail with reference to the accompanying drawings.

FIG. 1 is a plan view illustrating a semiconductor device according to an exemplary embodiment of the inventive concepts. FIGS. 2a, 2b and 2c are cross-sectional views corresponding to lines I-I′, II-II′ and III-III′ of FIG. 1, respectively.

Referring to FIGS. 1 and 2 a through 2 c, a semiconductor substrate 1 may include a first region A and a second region B. The first region A may be disposed at a left side and the second region B may be disposed a right side. The substrate 1 may include a device isolation layer and/or transistors. A first interconnection layer L1, a second interconnection layer L2, a third interconnection layer L3, and a fourth interconnection layer L4 may be sequentially stacked on the substrate 1.

The first interconnection layer L1 may include a first interlayer dielectric layer 3, a plurality of eleventh conductive patterns 10 a, a plurality of twelfth conductive patterns 10 b, a thirteenth conductive pattern 10 c, and a plurality of first air gaps AG1. The first interlayer dielectric layer 3 may include a silicon oxide layer having a lower dielectric constant, for example, a SiOCH layer and/or a porous-SiOCH layer. A first recess R1 may be formed in the first interlayer dielectric layer 3 disposed in the second region B. The eleventh conductive patterns 10 a may be formed in the first region A and the twelfth conductive patterns 10 b may be formed in the second region B. The thirteenth conductive pattern 10 c may be formed at a boundary of the first region A and the second region B. A portion of the thirteenth conductive pattern 10 c and the twelfth conductive patterns 10 b are disposed in the first recess R1. Another portion of the thirteenth conductive pattern 10 c and sidewalls of the eleventh conductive patterns 10 a may be covered by the first interlayer dielectric layer 3. The eleventh through thirteenth conductive patterns 10 a through 10 c may be line patterns formed in parallel and may extend along a direction, for example, Y-direction.

Each of the eleventh through thirteen conductive patterns 10 a, 10 b, and 10 c may include a first wiring line 7 and a first metal diffusion barrier layer 5 that covers a bottom and sidewalls of the first wiring line 7. The first wiring line 7 may be formed of a metal material, for example, aluminum (Al) and/or tungsten (W). The first metal diffusion barrier layer 5 may include at least one of titanium (Ti), titanium nitride (TiN), tantalum (Ta), tantalum nitride (TaN), ruthenium (Ru), cobalt (Co), manganese (Mn), tungsten nitride (WN), nickel (Ni) or nickel boron (NiB). A first capping layer 9 a may be formed on the eleventh through thirteen conductive patterns 10 a, 10 b, and 10 c. The first capping layer 9 a may be formed of a metal nitride including at least one of tantalum (Ta), ruthenium (Ru), cobalt (Co), manganese (Mn), titanium (Ti), tungsten (W), nickel (Ni), aluminum (Al) or a mixture thereof.

In the first region A, upper surfaces of the eleventh conductive patterns 10 a, a portion of an upper surface of the thirteenth conductive pattern 10 c, and an upper surface of the first interlayer dielectric layer 3 may be covered by a first mask pattern M1. The first mask pattern M1 may include at least one of silicon carbon nitride (SiCN), silicon nitride (SiN), or silicon oxycarbide (SiOC). The first mask pattern M1 may have a mechanical strength greater than that of the first interlayer dielectric layer 3. An upper surface of the first mask pattern M1 may be covered by a first insulating diffusion barrier layer 11. The first insulating diffusion barrier layer 11 may include at least one of silicon carbon nitride (SiCN), silicon nitride (SiN), or silicon oxycarbide (SiOC). The first insulating diffusion barrier layer 11 may extend to the second region B and cover the upper surfaces and both sidewalls of the twelfth conductive patterns 10 b and a sidewall of the thirteenth conductive pattern 10 c. In the second region B, the first insulating diffusion barrier layer 11 may define the first air gaps AG1 between adjacent ones of the twelfth conductive patterns 10 b.

Next, the second interconnection layer L2 will be explained in detail. The second interconnection layer L2 may be formed on the first interconnection layer L1 and have, a similar structure. However, a plurality of air gaps may be formed in a different side, i.e., the second region B, in the second interconnection layer L2.

The second interconnection layer L2 may include a second interlayer dielectric layer 13. A second recess R2 may be formed in the second interlayer dielectric layer 13 in the first region A. A plurality of twenty-first conductive patterns 20 a may be formed in the second recess R2. In the second region B, a plurality of twenty-second conductive patterns 20 b may be formed in the second interlayer dielectric layer 13. A twenty-third conductive pattern 20 c may be formed at a boundary of the first region A and the second region B. Each of the twenty-first through twenty-third conductive patterns 20 a, 20 b, and 20 c may include a second wiring line 17 and a second metal diffusion barrier layer 15. Upper surfaces of the twenty-first through twenty-third conductive patterns 20 a, 20 b, and 20 c may be covered by a second capping layer 19 a. In the second region B, upper surfaces of the twenty-second conductive patterns 20 b and a portion of the twenty-third conductive pattern 20 c may be covered by a second mask pattern M2. A second insulating diffusion barrier layer 21 may be formed on the second mask pattern M2. The second insulating diffusion barrier layer 21 may cover upper surfaces of the twenty-first conductive patterns 20 a and sidewalls thereof. Second air gaps AG2 may be formed between adjacent ones of the twenty-first conductive patterns 20 a.

A third interconnection layer L3 may be formed on the second interconnection layer L2 and may have substantially the same structure as the first interconnection layer L1.

The third interconnection layer L3 may include a third interlayer dielectric layer 23. A third recess R3 may be formed in the third interlayer dielectric layer 23 in the second region B. A plurality of thirty-first conductive patterns 30 a may be formed in the third interlayer dielectric layer 23 and a plurality of thirty-second conductive patterns 30 b may be formed in the third recess R3. A thirty-third conductive pattern 30 c may be formed at a boundary of the first region A and second region B. Each of the thirty-first through thirty-third conductive patterns 30 a, 30 b, and 30 c may include a third wiring line 27 and a third metal diffusion barrier layer 25. Upper surfaces of the thirty-first through thirty-third conductive patterns 30 a, 30 b, and 30 c may be covered by a third capping layer 29 a. In the first region A, upper surfaces of the thirty-first conductive patterns 30 a and a portion of the thirty-third conductive pattern 30 c may be covered by a third mask pattern M3. A third insulating diffusion barrier layer 31 may be formed on the third mask pattern M3. The third insulating diffusion barrier layer 31 may cover upper surfaces of the thirty-second conductive patterns 30 b and sidewalls thereof. Third air gaps AG3 may be formed at between adjacent ones of the thirty-second conductive patterns 30 b.

A fourth interconnection layer L4 may be formed on the third interconnection layer L3 and may have substantially the same structure as the second interconnection layer L2.

The fourth interconnection layer L4 may include a fourth interlayer dielectric layer 33. A fourth recess R4 may be formed in the fourth interlayer dielectric layer 33 in the first region A. A plurality of forty-first conductive patterns 40 a may be formed in the fourth recess R4. In the second region B, a plurality of forty-second conductive patterns 40 b may be formed in the fourth interlayer dielectric layer 33. A forty-third conductive pattern 40 c may be formed at a boundary of the first region A and the second region B. Each of the forty-first through forty-third conductive patterns 40 a, 40 b, and 40 c may include a fourth wiring line 37 and a fourth metal diffusion barrier layer 35. Upper surfaces of the forty-first through forty-third conductive patterns 40 a, 40 b, and 40 c may be covered by a fourth capping layer 39 a. In the second region B, upper surfaces of the forth-second conductive patterns 40 b and a portion of the forty-third conductive pattern 40 c may be covered by a fourth mask pattern M4. A fourth insulating diffusion barrier layer 41 may be formed on the fourth mask pattern M4. The fourth insulating diffusion barrier layer 41 may extend to cover upper surfaces of the forty-first conductive patterns 40 a and sidewalls thereof. Fourth air gaps AG4 may be formed at between adjacent ones of the forty-first conductive patterns 40 a.

The eleventh, twenty-first, thirty-first, and forty-first conductive patterns 10 a, 20 a, 30 a, and 40 a may vertically overlap. The twelfth through forty-second conductive patterns 10 b, 20 b, 30 b, and 40 b may vertical overlap. The thirteenth through forty-third conductive patterns 10 c, 20 c, 30 c, and 40 c may vertically overlap.

The first air gaps AG1 are arranged so that they are not vertically overlapped by the second air gaps AG2. Instead, the first air gaps AG1 may be overlapped by the second interlayer dielectric layer 13 and the second mask pattern M2. The first mask pattern M1 and the first interlayer dielectric layer 3 may be disposed below the second air gaps AG2.

The second air gaps AG2 are arranged so that they are not vertically overlapped by the third air gaps AG3. Instead, the second air gaps AG2 may be vertically overlapped by the third interlayer dielectric layer 23 and the third mask pattern M3. The second mask pattern M2 and the second interlayer dielectric layer 13 may be disposed below the third air gaps AG3.

The third air gaps AG3 are arranged such that they are not vertically overlapped by the fourth air gaps AG4. The third air gaps AG3 may be vertically overlapped by the fourth interlayer dielectric layer 33 and the fourth mask pattern M4. The third mask pattern M3 and the third interlayer dielectric layer 23 may be disposed below the fourth air gaps AG4.

Mechanical strength and reliability of semiconductor devices manufactured according to some embodiments of the inventive concepts may be increased by forming the non-overlapped air gaps AG1 through AG4 in the stacked interconnection layers. Furthermore, mechanical strength of semiconductor devices may be further increased by the mask patterns M1 through M2. The thirteenth through forty-third conductive patterns 10 c through 40 c may help to increase the mechanical strength of the semiconductor device. Signal transfer rate of the semiconductor device manufactured according to some embodiments of the inventive concepts may be increased by the presence of the air gaps AG1 through AG4, which may decrease parasitic capacitance between the conductive patterns in each of the interconnection layers L1 through L4.

Various methods of manufacturing the semiconductor device according to exemplary embodiments of the inventive concepts will now be described.

FIGS. 3 through 11 are cross-sectional views illustrating a method of manufacturing a semiconductor device according to an exemplary embodiment of the inventive concepts corresponding to FIG. 2A.

Referring to FIG. 3, a substrate 1 having a first region A and a second region B may be provided. A first interlayer dielectric layer 3 may be formed on the substrate 1. A plurality of line-type grooves may be formed in the first interlayer dielectric layer 3 by patterning the first interlayer dielectric layer 3. A first metal diffusion barrier layer 5 may be conformally formed in the line-type grooves and a conductive layer may be formed on the first metal diffusion barrier layer 5 in order to fill the line-type grooves. A planarization process may be performed to the conductive layer and the first metal diffusion barrier layer 5 to expose an upper surface of the first interlayer dielectric layer 3 and to form eleventh through thirteenth conductive patterns 10 a, 10 b, and 10 c in the line-type grooves. A first capping layer 9 a may be formed on each of the eleventh through thirteenth conductive patterns 10 a, 10 b, and 10 c. The first capping layer 9 a may be formed by using a deposition process, for example, a chemical vapor deposition process or an atomic layer deposition process. The first capping layer 9 a may be formed by using, for example, an electroplating process. The first capping layer 9 a may include, for example, cobalt (Co). The first capping layer 9 a may be absent from the upper surface of the first interlayer dielectric layer 3.

Referring to FIG. 4, a first mask pattern M1 may be formed on the first interlayer dielectric layer 3 disposed in the first region A, leaving an upper surface of the first interlayer dielectric layer 3 disposed in the second region B exposed. The first mask pattern M1 may be formed by patterning a mask layer after forming the mask layer entirely on the first interlayer dielectric layer 3. The first mask pattern M1 may include at least one of silicon carbon nitride (SiCN), silicon nitride (SiN), or silicon oxycarbide (SiOC).

Referring to FIG. 5, a first recess R1 may be formed in the second region B by etching the first interlayer dielectric layer 3 using the first mask pattern M1 as an etch mask. Sidewalls of the twelfth conductive patterns 10 b and a sidewall of the thirteenth conductive pattern 10 c may be exposed in forming the first recess RI. The first capping layer 9 a may protect the twelfth conductive patterns 10 b and the thirteenth conductive pattern 10 c from being damaged by an etch source gas when the first recess R1 is formed using an etch process.

Referring to FIG. 6, a first insulating diffusion barrier layer 11 may be formed on the upper surface of the substrate 1. The first insulating diffusion barrier layer 11 may be formed by using a deposition method having a poor step coverage characteristic, e.g., a sputtering process or a physical vapor deposition process. Therefore, first air gaps AG1 may be formed between adjacent ones of the twelfth conductive patterns 10 b even though the first, insulating diffusion barrier layer 11 may have a uniform thickness on the first mask pattern M1. One of the first air gaps AG1 may be formed between the thirteenth conductive pattern 10 c and an adjacent one of the twelfth conductive patterns 10 b. A first interconnection layer L1 may comprise the first interlayer dielectric layer 3, the eleventh conductive patterns 10 a, the twelfth conductive patterns 10 b, the thirteenth conductive pattern 10 c, the first mask pattern M1, and the first air gaps AG1.

Referring to FIG. 7, a second interlayer dielectric layer 13 may be formed on the first interconnection layer L1. Twenty-first, twenty-second, and twenty-third conductive patterns 20 a, 20 b, and 20 c may be formed in the second interlayer dielectric layer 13. A second capping layer 19 a may be formed on the twenty-first through twenty-third conductive patterns 20 a through 20 c.

Referring to FIG. 8, a second mask pattern M2 may be formed that covers the second interlayer dielectric layer 13 in the second region B and exposes the second interlayer dielectric layer 13 in the first region A. Referring to FIG. 9, a second recess R2 may be formed in the first region A by etching the second interlayer dielectric layer 13 using the second mask pattern M2 as an etch mask. Sidewalls of the twenty-first conductive patterns 20 a and a sidewall of the twenty-third conductive pattern 20 c may be exposed in forming the second recess R2. The second capping layer 19 a may protect the twenty-first conductive patterns 20 a and the twenty-third conductive pattern 20 c from being damaged by an etch source gas when the second recess R2 is formed using an etch process.

Referring to FIG. 10, a second insulating diffusion barrier layer 21 may be formed on the upper surface of the substrate 1. The second insulating diffusion barrier layer 21 may be formed by using a deposition method having a poor step coverage characteristic, e.g., a sputtering process or a physical vapor deposition process. Therefore, second air gaps AG2 may be formed between adjacent ones of the twenty-first conductive patterns 20 a even though the second insulating diffusion barrier layer 21 may have a uniform thickness on the second mask pattern M2. One of the second air gaps AG2 may be formed between the twenty-third conductive pattern 20 c and an adjacent one of the twenty-first conductive patterns 20 a. A second interconnection layer L2 may comprise the second interlayer dielectric layer 13, the twenty-first conductive patterns 20 a, the twenty-second conductive patterns 20 b, the twenty-third conductive pattern 20 c, the second mask pattern M2, and the second air gaps AG2.

Referring to FIG. 11, a third interconnection layer L3 may be formed on the second interconnection layer L2. The third interconnection layer L3 may be formed by using substantially the same process as the method of forming the first interconnection layer L1.

Referring to FIG. 2A again, a fourth interconnection layer L4 may be formed on the third interconnection layer L3. The fourth interconnection layer L4 may be formed by using substantially the same process as the method of forming the second interconnection layer L2.

Semiconductor devices having first through fourth air gaps AG1 through AG4 arranged such that air gaps of immediately adjacent layers do not overlap by arranging the air gaps on alternating sides in successive layers has been described. In further embodiments, semiconductor devices may have other arrangements of non-overlapping air gaps. Semiconductor device having air gaps arranged alternately in each of the interconnection layers will be described. For example, the first air gaps AG1 may be formed in the first interconnection layer L1 and the second air gaps AG2 may be formed in the third interconnection layer L3. The semiconductor device may not have any air gaps in the second interconnection layer L2 or in the fourth interconnection layer L4.

FIG. 12 is a plan view illustrating a semiconductor device according to another exemplary embodiment of the inventive concepts. FIG. 13a is a cross-sectional view corresponding to line I-I′ of FIG. 12.

Referring to FIGS. 12 and 13, a semiconductor device may comprise first through fourth interconnection layers L1, L2, L3, and L4 which are sequentially formed on a substrate 1. A plurality of first air gaps AG1 may be formed in the first interconnection layer L1 and a plurality of second air gaps AG2 may be formed in the third interconnection layer L3. There is no air gap in the second interconnection layer L2 and in the fourth interconnection layer L4. The semiconductor device shown in FIGS. 12 and 13 may have substantially the same structure as the structures shown in the second region B of FIGS. 1 and 2 a, respectively.

In detail, the first interconnection layer L1 may include a first interlayer dielectric layer 3. The first interlayer dielectric layer 3 may have a first recess R1 formed therein. A plurality of first conductive patterns 10 spaced apart from each other may be disposed in the first recess R1. Upper surfaces of the first conductive patterns 10 may be covered by a first capping layer 9 a and a first insulating diffusion barrier layer 11. The first insulating diffusion barrier layer 11 may define first air gaps AG1 between adjacent ones of the first conductive patterns 10.

The second interconnection layer L2 may include a second interlayer dielectric layer 13 covering the first interconnection layer L1. A plurality of second conductive patterns 20 may be disposed in the second interlayer dielectric layer 13. There are no air gaps between the second conductive patterns 20, i.e., the second interlayer dielectric layer 13 may substantially fill spaces between the second conductive patterns 20. Upper surfaces of the second conductive patterns 20 may be covered by a second capping layer 19 a. Upper surfaces of the second conductive patterns 20 and the second interlayer dielectric layer 13 may be covered by a second mask pattern M2. A second insulating diffusion barrier layer 21 may be disposed on the second mask pattern M2. In some embodiments, the second mask pattern M2 and the second insulating diffusion barrier layer 21 may be omitted.

The third interconnection layer L3 may include a third interlayer dielectric layer 23 covering the second interconnection layer L2. The third interlayer dielectric layer 23 may have a third recess R3 formed therein. A plurality of third conductive patterns 30 spaced apart from each other may be disposed in the third recess R3. Upper surfaces of the third conductive patterns 30 may be covered by a third capping layer 29 a and a third insulating diffusion barrier layer 31. The third insulating diffusion barrier layer 31 may define second air gaps AG2 between adjacent ones the first conductive patterns 30.

The fourth interconnection layer L4 may include a fourth interlayer dielectric layer 33 covering the third interconnection layer L3. A plurality of fourth conductive patterns 40 may be disposed in the fourth interlayer dielectric layer 33. There are air gaps between the fourth conductive patterns 40, i.e., the fourth interlayer dielectric layer 33 may substantially fill the spaces between adjacent ones of the fourth conductive patterns 40. Upper surfaces of the fourth conductive patterns 40 may be covered by a fourth capping layer 39 a. Upper surfaces of the fourth conductive patterns 40 and the fourth interlayer dielectric layer 33 may be covered by a fourth mask pattern M4. A fourth insulating diffusion barrier layer 41 may be disposed on the fourth mask pattern M4. In some embodiments, the fourth mask pattern M4 and the fourth insulating diffusion barrier layer 41 may be omitted.

As shown in FIG. 13, the semiconductor device may have air gaps in the first and third interconnection layers L1 and L3. However, in another exemplary embodiment, the semiconductor device may have air gaps in the second and fourth interconnection layers L2 and L4 and may lack air gaps in the first and third interconnection layers L1 and L3.

Further exemplary embodiments will be now being described. Semiconductor devices according to further embodiments may include air gaps in each interconnection layer formed in an alternating fashion.

FIG. 14 is a plan view illustrating semiconductor devices according to still another exemplary embodiment of the inventive concepts. FIG. 15a is a cross-sectional view corresponding to line I-I′ of FIG. 14, FIG. 15b is a cross-sectional view corresponding to line II-II′ of FIG. 14, FIG. 15c is a cross-sectional view corresponding to line of FIG. 14, and FIG. 15d is a cross-sectional view corresponding to line IV-IV′ of FIG. 14.

Referring to FIGS. 14 and 15 a through 15 d, a substrate 1 may have first through fourth regions A, B, C, and D. The first region A may be adjacent the second region B in a first direction (X-direction) and may be adjacent the third region C in a second direction (Y-direction). The third region C may be adjacent the fourth region D in the first direction and the second region B may be adjacent the fourth region D in the second direction.

First through fourth interconnection layers L1, L2, L3, and L4 may be sequentially formed on the substrate 1. The first interconnection layer L1 may include eleventh through thirteenth conductive patterns 10 a, 10 b, and 10 c which extend in the second direction. The eleventh through thirteenth conductive patterns 10 a, 10 b, and 10 c may be parallel line-shaped patterns. First air gaps AG1 may be disposed between adjacent ones of the eleventh conductive patterns 10 a in the second region C and between adjacent ones of the twelfth conductive patterns 10 b in the third region B. However, there are no air gaps between adjacent ones of the eleventh conductive patterns 10 a in the first region A and between adjacent ones of the twelfth conductive patterns 10 b in the fourth region D.

Second air gaps AG2 may be disposed in the second interconnection layer L2. However, the location of the second air gaps AG2 may be different from the first air gaps AG1. In particular, the second air gaps AG2 may be disposed in the first region A and in the fourth region D.

Third air gaps AG3 may be disposed in the third interconnection layer L3. The location of the third air gaps AG3 may be similar to the first air gaps AG1. Fourth air gaps AG4 may be disposed in the fourth interconnection layer L4. The location of the fourth air gaps AG4 may be similar to the second air gaps AG2. Operations for forming the third air gaps AG3 and the fourth air gaps AG4 may be substantially the same as those described above with reference to FIGS. 1 through 11.

FIG. 16 is a cross-sectional view, corresponding to line I-I′ of FIG. 1, illustrating a semiconductor device according to still another exemplary embodiment of the inventive concepts.

Referring to FIG. 16, the semiconductor device may not include any mask patterns. The mask patterns M1, M2, M3, and M4 described above with reference to FIGS. 1-11 may be removed before forming the insulating diffusion barrier layers 11, 21, 31, and 41. The method of forming the other layers may be substantially the same as the method described in description corresponding to FIGS. 1 through 11.

FIG. 17 is a cross-sectional view illustrating a semiconductor device according to still further embodiments of the inventive concepts. Referring to FIG. 17, a semiconductor device may include a fifth through eighth capping layers 9 b, 19 b, 29 b, and 39 b between mask patterns (M1, M2, M3, and M4) and interlayer dielectric layers (3, 13, 23, and 33) in interconnection layers L1, L2, L3, and L4, respectively. The fifth through eighth capping layers 9 b, 19 b, 29 b, and 39 b may include metal oxynitride layers, for example, aluminum oxynitride layers. The fifth through eighth capping layers 9 b, 19 b, 29 b, and 39 b may be formed simultaneously when the first through fourth capping layers 9 a, 19 a, 29 a, and 39 a are formed, respectively.

FIG. 18 is a plan view illustrating a semiconductor device according to further embodiments of the inventive concepts. FIG. 19 is a cross-sectional view corresponding to line I-I′ of FIG. 18.

Referring to FIGS. 18 and 19, a first interconnection layer L1 and a second interconnection layer L2 may be sequentially formed on a substrate 1. The first interconnection layer L1 may include a first interlayer dielectric layer 3 having a first recess R1 formed therein. Eleventh conductive patterns 10 a may be disposed in the first interlayer dielectric layer 3 and twelfth conductive patterns 10 b may be disposed in the first recess R1. A thirteenth conductive pattern 10 c may be disposed at a boundary between the eleventh conductive patterns 10 a and the twelfth conductive patterns 10 b. Upper surfaces of the eleventh conductive patterns 10 a and a portion of an upper surface of the thirteenth conductive pattern 10 c may be covered by a first mask pattern M1. The first mask pattern M1 may be covered by a first insulating diffusion barrier layer 11. The first insulating diffusion barrier layer 11 may be formed in gaps between adjacent ones of the twelfth conductive patterns 10 b and may define first air gaps AG1.

The second interconnection layer L2 may include a second interlayer dielectric layer 13 covering the first interconnection layer L1. The second interlayer dielectric layer 13 may have a second recess R2 defined therein on an opposite side of substrate 1 than the first recess R1. Twenty-first conductive patterns 20 a may be disposed in the second recess R2. Twenty-second conductive patterns 20 b may be formed in the second interlayer dielectric layer 13. A twenty-third conductive pattern 20 c may be disposed at a boundary between the twenty-first conductive patterns 20 a and the twenty-second conductive patterns 20 b. Each of the twenty-third conductive patterns 20 c extend in a direction (Y-direction) and may include a second wiring line 17, a conductive plug 17 c, and a second metal diffusion barrier layer 15. The conductive plug 17 c may extend from a bottom of the second wiring line 17 to the thirteenth conductive pattern 10 c. The conductive plug 17 c may be a via plug. Upper surfaces of the twenty-second conductive patterns 20 b and the twenty-third conductive pattern 20 c may be covered by a second mask pattern M2. The second mask pattern M2 may overlap the conductive plug 17 c. A second insulating diffusion barrier layer 21 may be disposed on the second mask pattern M2. The second insulating diffusion barrier layer 21 may cover upper surfaces of the twenty-first conductive patterns 20 a and sidewalls thereof. Second air gaps AG2 may be disposed between adjacent ones of the twenty-first conductive patterns 20 a.

A sidewall of the thirteenth conductive pattern 10 c may contact the first interlayer dielectric layer 3 and be positioned apart from the first air gaps AG1. A sidewall of the twenty-third conductive pattern 20 c may contact to the second interlayer dielectric layer 13 and be positioned apart from the first air gaps AG1. Operations for forming the other layers may be substantially the same as those described above with reference to FIGS. 1 through 11.

FIG. 20 is a plan view illustrating a semiconductor device according to further embodiments of the inventive concepts. FIG. 21 is a cross-sectional view corresponding to line I-I′ of FIG. 20.

Referring to FIGS. 20 and 21, the semiconductor device may be similar to the device illustrated in FIGS. 1 and 2A-C, but may not have the first through fourth conductive patterns 10 c, 20 c, 30 c, and 40 c at a boundary of the first region A and the second region B provided in the device illustrated in FIGS. 1 and 2A-2C. Interlayer dielectric layers 3 through 33 and mask patterns M1 through M4 may be alternately formed at a boundary between a first region A and a second region B. The interlayer dielectric layers 3 through 33 and the mask patterns M1 through M4 may perform as a support at the boundary. Operations, for forming the device of FIGS. 20 and 21 may be substantially similar to those described above with reference to FIGS. 1 through 11.

FIG. 22 is a block diagram of an electronic system including a semiconductor device according to an exemplary embodiment of the inventive concepts. Referring to FIG. 22, the system 1100 may comprise a controller 1110, an input/output device 1120, a memory device 1130, an interface 1140, and a bus 1150. The controller 1110, the input/output device 1120, the memory device 1130, and the interface 1140 may communicate with each other through the bus 1150. The bus 1150 may correspond to a path over which data can be moved between system elements.

The controller 1110 may comprise a microprocessor, a digital signal processor, a microcontroller, or a similar device that can control an executive program. The input/output device 1120 may comprise a keypad, a keyboard, or a display. The memory device 1130 may not only save codes or data for executing the controller 1110 but also save data executed by the controller 1110.

The system 1100 may be applied to a product that can transport information, e.g., a PDA (personal digital assistant), a portable computer, a web tablet, a wireless phone, a mobile phone, a digital music player, or a memory card.

The memory device 1130 may comprise a semiconductor device, which has a non-volatile memory device according to an example embodiment of the inventive concepts.

The above-disclosed subject matter is to be considered illustrative and not restrictive, and the appended claims are intended to cover all such modifications, enhancements, and other embodiments, which fall within the true spirit and scope of the inventive concepts. Thus, the scope of the inventive concepts is to be determined by the broadest permissible interpretation of the following claims and their equivalents, and shall not be restricted or limited by the foregoing detailed description. 

What is claimed is:
 1. A semiconductor device comprising: a substrate; an interlayer dielectric layer on the substrate; first conductive lines disposed in the interlayer dielectric layer; second conductive lines disposed in a recess in the interlayer dielectric layer; and a diffusion barrier layer disposed on and between adjacent ones of the second conductive lines in the recess in the interlayer dielectric layer, the diffusion barrier layer defining respective air gaps between sidewalls of adjacent ones of the second conductive lines, wherein the diffusion barrier also overlies the first conductive lines and further comprising a strengthening layer interposed between the interlayer dielectric layer and the diffusion barrier layer and overlying the first conductive lines, wherein the strengthening layer does not overlie the second conductive lines.
 2. A semiconductor device comprising: a substrate; an interlayer dielectric layer on the substrate; first conductive lines disposed in the interlayer dielectric layer; second conductive lines disposed in a recess in the interlayer dielectric layer; and a diffusion barrier layer disposed on and between adjacent ones of the second conductive lines in the recess in the interlayer dielectric layer, the diffusion barrier layer defining respective air gaps between sidewalls of adjacent ones of the second conductive lines, wherein the diffusion barrier also overlies the first conductive lines and further comprising a strengthening layer interposed between the interlayer dielectric layer and the diffusion barrier layer and overlying the first conductive lines, wherein the interlayer dielectric layer comprises a first interlayer dielectric layer, wherein the diffusion barrier layer comprises a first diffusion barrier layer, wherein the air gaps comprise first air gaps, and further comprising: a second interlayer dielectric layer on the first barrier diffusion layer; third conductive lines disposed in the interlayer dielectric layer overlying the second conductive lines; fourth conductive lines disposed in a recess in the second interlayer dielectric layer overlying the first conductive lines; and a second diffusion barrier layer disposed on and between adjacent ones of the fourth conductive lines in the recess in the second interlayer dielectric layer, the second diffusion barrier layer defining respective second air gaps between sidewalls of adjacent ones of the fourth conductive lines.
 3. The semiconductor device of claim 2, wherein the first diffusion barrier also overlies the first conductive lines, wherein the second diffusion barrier layer also overlies the third conductive lines and further comprising: a first strengthening layer interposed between the first interlayer dielectric layer and the first diffusion barrier layer and overlying the first conductive lines; and a second strengthening layer interposed between the second interlayer dielectric layer and the second diffusion barrier layer and overlying the third conductive lines.
 4. A semiconductor device comprising: a substrate including a first region and a second region spaced apart from each other in a first direction, lower conductive patterns disposed on the substrate, and including first lower conductive patterns on the first region and second lower conductive patterns on the second region; a first interlayer dielectric layer disposed between the first lower conductive patterns; a first air gap provided in a space between the second lower conductive patterns; upper conductive patterns including first upper conductive patterns disposed on the first lower conductive patterns and second upper conductive patterns disposed on the second lower conductive patterns; a second air gap provided in a space between the first upper conductive patterns; a second interlayer dielectric layer disposed between the second upper conductive patterns; and a mask pattern disposed between the first interlayer dielectric layer and the second air gap.
 5. The semiconductor device of claim 4, wherein the first interlayer dielectric layer is completely filled with in a space between the first lower conductive patterns.
 6. The semiconductor device of claim 4, wherein the second interlayer dielectric layer is completely filled with in a space between the second upper conductive patterns.
 7. The semiconductor device of claim 4, wherein the mask pattern is in contact with upper surfaces of the first lower conductive patterns, and spaced apart from upper surfaces of the second lower conductive patterns.
 8. The semiconductor device of claim 7, further comprising a first diffusion barrier layer disposed between the second lower conductive patterns, wherein the first diffusion barrier layer is partially filled with in the space between the second lower conductive patterns to define the first air gap.
 9. The semiconductor device of claim 8, wherein the first interlayer dielectric layer includes a different material from the first diffusion barrier layer.
 10. The semiconductor device of claim 8, wherein the first diffusion barrier layer extends onto an upper surface of the mask pattern.
 11. The semiconductor device of claim 8, further comprising a second diffusion barrier layer disposed between the first upper conductive patterns, wherein the second diffusion barrier layer is partially filled with in the space between the first upper conductive patterns to define the second air gap.
 12. The semiconductor device of claim 8, wherein the first diffusion barrier layer is in contact with the second interlayer dielectric layer, and spaced apart from the first interlayer dielectric layer.
 13. The semiconductor device of claim 4, wherein the lower conductive patterns and the upper conductive patterns extend in a second direction crossing to the first direction.
 14. The semiconductor device of claim 4, wherein the mask pattern overlaps the second air gap, and does not overlap the first air gap. 